The Supra 40 instrument is an SEM equipped with a Field Emission Source (FEG4) used for high-resolution imaging. The multi-detector equipment designed and installed for specific analyses, from morphological to phase contrast imaging allows fine and in-depth investigation of samples. The STEM detector enables imaging using transmitted electrons with improved final resolution (1 nm). The TEM grid holder that can accommodate up to12 grids is also available.
In addition, special holders can be designed and constructed. The large chamber can accommodate sample sizes up to 10 cm. The system also includes a state-of-the-art EDS detector (from Oxford) for elemental microanalysis, including elemental mapping capability.
Hard materials are the typical samples investigated with the Supra 40 microscope. STEM is effective with nanoparticles, rods, or fibers for catalytic and biological samples (after a proper drying procedure).
Facility manager: Simone Dal Zilio (facility manager, technologist). Technical staff in
charge: Behnaz Abbasgholi Nejad Asbaghi (post-doc, user support).
Availability
Location
CNR Electron Microscopy Facility
Q2 Building - Area Science Park Strada Statale 14 km 163.5 - 34149 Basovizza - Trieste
Access
Output examples
SEM imaging of Metal-Organic Frameworks
