The AFM is equipped with modules for standard imaging of topography in contact and non-contact modes, as well as modules that provide imaging in different modes, such as: conductive atomic force microscopy (ConAFM), electrostatic force microscopy (EFM), magnetic force microscopy (MFM). The AFM has a piezo drive that provides a resolution of up to 0.1 nm in the vertical direction and up to tens of nanometers in the lateral direction.
AFM can be used to study surface morphology with sub-nanometric resolution, as well as magnetic, electrostatic, and conductive surface properties of the sample surface. This microscope enables conduction probe and Kelvin probe analysis (Bruker CP-II, APE Research A100) and is designed to investigate the surface topography of solid samples with high resolution.
Responsible for the instrument: Dr. Vadym Tkachuk.
Availability
Location
Laboratory of Organic Matter Physics
Univerza v Novi Gorici, Vipaska 11c, 5270 Ajdovščina, Slovenia
Access
This instrument is available for 6 hours per week for ALL-MICRO network activities.
Output examples
(a) AFM image showing the morphology of a thin film of organic molecules (C8-BTBT) deposited on hexagonal Boron Nitride (h-BN) substrate. (b) AFM image showing the morphology of organic molecules (C8-BTBT) deposited onto a graphene-based field-effect transistor.
