The JEM 2100f-UHR Field Emission Transmission Electron Microscope (JEOL) has an accelerating voltage of 80 to 200 kV and can reach resolutions up to a tenth of a nm. It can also be used in STEM mode (0.2 nm resolution), in both dark and bright fields. It is equipped with an energy-dispersive X-ray spectroscopy apparatus (EDS, X-MAX 80T, Oxford instruments).
The microscope can be used in a classical High-Resolution TEM (HR-TEM) mode for imaging the samples with atomic resolution (0.1 nm at 200 KeV) and for diffraction in selected areas. The Dark-field STEM unit can be used for phase identification based on atomic number contrast with a resolution of a few nm. The analysis can be extended to the compositional analysis (EDX spectroscopy or maps). For unstable samples, it is possible to reduce the beam energy to 80 keV. Besides structural, morphological, and compositional analysis, this TEM is also used as one of the standard methods for performing particle size analysis. Other typical applications of the instrument include: composition and defect analysis, investigation of the effects of production processes, and size distribution of (nano)particles in a sample.
Beside standard deposition (from suspension) on TEM grid/supports, the Laboratory can provide preparation of TEM-observable specimens, both for bulk materials and for cross-sections, through all the preparation steps, from cutting to thinning, final polishing and coating.
Responsible for the instrument: Assoc. Prof. Mattia Fanetti. Technical staff in charge: Dr. Blaž Belec.
Availability
Location
Laboratorij za raziskave materialov, Univerza v Novi Gorici
Vipaska 11c, 5270 Ajdovščina, Slovenia
Access
This instrument is available for 6 hours per week for ALL-MICRO network activities.
Output examples
TEM and corresponding HAADF STEM image of anisotropic Bi2Se3 nanoplatelets oriented edge-on, with its larger surfaces parallel to the electron beam (a and b, respectively) and HRTEM image of Cu nanoparticle.
